Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser

We report a wavelength swept laser-based full-field optical coherence tomography for measuring the surfaces and thicknesses of refractive and reflective samples. The system consists of a galvo filter-based wavelength swept laser and a simple Michelson interferometer. Combinations of the reflective and refractive samples are used to demonstrate the performance of the system. By synchronizing the camera with the source, the cross-sectional information of the samples can be seen after each sweep of the swept source. This system can be effective for the thickness measurement of optical thin films as well as for the depth investigation of samples in industrial applications. A resolution target with a glass cover slip and a step height standard target are imaged, showing the cross-sectional and topographical information of the samples.